Accelerated Aging and Contact Degradation of CIGS Solar Cells.pdf

Accelerated Aging and Contact Degradation of CIGS Solar Cells.pdf

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時間:2019-03-20

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1、514IEEEJOURNALOFPHOTOVOLTAICS,VOL.3,NO.1,JANUARY2013AcceleratedAgingandContactDegradationofCIGSSolarCellsThomasOtt,ThomasWalter,DimitriosHariskos,OliverKiowski,andRaymundSchaf?er¨AbstractThelong-termstabilityofsolarcellsisacrucialfactorasedconditionsinthedark,e.g.,in[3].Furthermore,activat

2、ionforthecompetitivenessofatechnology.Inthisstudy,theacceler-energiesforparameterdriftsofopen-circuitvoltageand?llatedagingofCu(In,Ga)Se2(CIGS)solarcellswasstudied,andfactor(FF)atelevatedtemperaturesweredeterminedandthethein?uenceofanappliedbiasduringtheendurancetestonthemeantimetofailure(

3、MTTF),well-knownfromthereliabilityopen-circuitvoltageVocand?llfactor(FF)wasinvestigated.Timeconstantsforparameterdriftsoftheopen-circuitvoltageandtheofmicroelectronicscircuits,wascalculated[4]inordertoassessassociatedactivationenergyweredetermined.Theobservedpa-andextrapolatethelifetimeoft

4、hedevicesundernormalopera-rameterdriftswillbediscussed,andamodelwillbeproposedtionconditions(NOCT).Resultsoftheselife-timepredictionsbasedonsolarcellcapacitancesimulator(SCAPS)simulations,ex-seemednottobecriticalforparameterssuchasopen-circuitplainingtheobservedbehavioroftheelectricalchara

5、cteristicsofvoltageandFF.Inaddition,thein?uenceofanappliedpositivethesolarcells.Therefore,cellsweredarkannealedunderdrycon-ditionsattwodifferenttemperaturesanddifferentvoltagebiasesornegativebiasduringtheendurancetestswasinvestigatedbywereappliedtothecells.Ourstudyrevealedthattheapplicatio

6、nseveralstudies,e.g.,see[5].Itwasobservedthattheleveloftheofapositivebias,whichissimilartolightsoaking,?rstleadstoanopen-circuitvoltageremainsconstantaftera?rstfastincreaseorimprovementandstabilizationoftheopen-circuitvoltageandFFdecreaseaffectedbyanappliedpositiveornegativebias.Itcouldfol

7、lowedbyaslowdecreaseoftheseparameters.Thislong-termbealsoshownthattheapplicationofapositivebiascorrespondsdecreasecanbeexplainedintermsofabackbarrierorphoto-transistor,assimulatedwithSCAPS.However,applyingapositivetothesituationofalightsoak.Furthermore,theseex

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